Atomic resolution scanning transmission electron microscopy (theoretical focus) (UoM based)
This project advances atomic resolution scanning electron microscopy and its application in materials science. We will exploit recent advances in detector technology to obtain data in the diffraction plane obtained as an atomic sized probe is scanned across the specimen. Data can also be acquired as a function of probe position when vacancies in atomic orbitals, created after ionization by the probing electrons, are filled and x-rays are emitted (energy-dispersive x-ray analysis).
Using recent theoretical developments to consider the multiple inelastic scattering of the probe, the projected potential of the structure can be determined quantitatively at atomic resolution and the atoms identified using the x-ray data.
One application of this research will be the analysis of the atomic-scale composition of ultrathin (less than 2 nm) metal alloy nanowires [for example Au + (Cu or Pd or Pt)]. The full angular dependence of scattering of electrons which have been scattered both elastically and inelastically in the specimen will be exploited by comparison with electron scattering theory. This project offers both theoretical and experimental challenges at the leading edge of microscopy and structure determination in materials science.
Home University: The University of Melbourne
Partner University: RWTH Aachen University
Work Plan: Subject to change.
Year 1: UoM
Year 2: UoM
Year 3: FZJ